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0 索取号:R541/E8018 作者: 出版社:Stockholm : Almqvist & Wiksell ; New York : John Wiley & Sons, [1972].
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0 索取号:R545.1-53/E901 作者: 出版社:New York : Raven Press, 1984.
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0 索取号:O413.1/E9911 作者:Bayfield、 James E.、 1938-、 出版社:New York : John Wiley, 1999.
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0 索取号:O431.2/E991 作者:Scottish UniversitiesʼאSummer School in Physics (50th : 1998 : St. Andrews、 Scotland)、Miller、 A. (Alan)、Ebrahimzadeh、 M. (Mjaid)、Finlayson、 D. M.、 出版社:Bristol, [England] : Scottish Universities Summer School in Physics ; Philadelphia : Institute of Physics Pub., 1999.
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0 索取号:TN349/E901 作者:Pearman、 Richard A.、 出版社:Reston, Va. : Reston Pub. Co., 1980.
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0 索取号:TK51-53/E803/1976 作者:International Symposium on Solar Energy、 Washington、 D.C.、 1976.、Berkowitz、 Joan、 1931-、Lesk、 Israel Arnold、 1927-、Electrochemical Society. Electronics Division.、Electrochemical Society. Electrothermics and Metallurgy Division.、 出版社:Princeton, N.J. : Electrochemical Society, 1976.
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0 索取号:TL341-53/E801/1975 作者:Symposium on Structural Materials for Service at Elevated Temperatures in Nuclear Power Generation、 Houston、 Tex.、 1975.、Schaefer、 A. O.、 1901-、American Society of Mechanical Engineers.、Metal Properties Council.、 出版社:New York : American Society of Mechanical Engineers, 1975.
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0 索取号:TM0/E902 作者:Rosen、 Stan.、 出版社:New York : Wiley, 1987.
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0 索取号:TM11/E901 作者:Beiser、 Arthur.、 出版社:New York : McGraw-Hill, 1981.
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0 索取号:TM926/E801 作者:Butchbaker、 A. F.、 出版社:Ames : Iowa State University, 1977.
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0 索取号:TM93-53/E902/11 作者:Test Conference (11th : 1980 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、 出版社:New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office, 1980.
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0 索取号:TM93-53/E901/1982 作者:International Test Conference (1982)、IEEE Computer Society. Test Technology Committee.、International Test Foundation.、IEEE Computer Society.、IEEE Computer Society. Philadelphia Section.、 出版社:Silver Spring, MD (1109 Spring St., Suite 300) : IEEE Computer Society Press, 1982.
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0 索取号:TM93-53/E901/1983 作者:International Test Conference (14th : 1983 : Philadelphia、 Pa.)、IEEE Computer Society. Test Technology Committee.、Institute of Electrical and Electronics Engineers. Philadelphia Section.、 出版社:Silver Spring, MD : IEEE Computer Society Press, 1983.
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0 索取号:TL5-53/E803/4 作者:Conference on the Scientific & Industrial Applications of Small Accelerators、 4th、 North Texas State University、 1976.、Duggan、 Jerome L.、Morgan、 I. L. (Ira Lon)、 1926-、United States. Energy Research and Development Administration.、Institute of Electrical and Electronics Engineers.、 出版社:New York : Institute of Electrical and Electronics Engineers ; Piscataway, N.J. : available from IEEE Service Center, c1976.
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0 索取号:TH74-55/E901/231 作者:International Optical Computing Conference、 Washington、 D.C.、 1980.、Rhodes、 William T.、IEEE Computer Society.、Society of Photo-optical Instrumentation Engineers.、 出版社:Bellingham, Wash. : Society of Photo-Optical Instrumentation Engineers, 1980.
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0 索取号:TH74-55/E901/232.2 作者:International Optical Computing Conference、 Washington、 D.C.、 1980.、Rhodes、 William T.、IEEE Computer Society.、Society of Photo-optical Instrumentation Engineers.、 出版社:Bellingham, Wash. : Society of Photo-Optical Instrumentation Engineers, c1980.
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